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        Silicon-Based 
      Laser Emits in Visible 
      Active layer of europium-doped GaN is 
      deposited on silicon substrate. Although much of the 
      excitement about silicon lasers in this year has centered on silicon Raman 
      lasers investigated at Intel Corp. and at the University of California, 
      Los Angeles, other researchers have pursued other promising approaches to 
      silicon-based lasers. Recently, scientists at the University of 
      Cincinnati, working with a group at Nitronex Corp. in Raleigh, N.C., 
      obtained visible lasing from a layer of Eu-doped GaN deposited on a 
      silicon substrate. Silicon is the fundamental building material for modern 
      electronics and would seem the obvious host for combining electronics and 
      photonics in monolithically integrated devices. Unfortunately, it turns 
      out to be a poor photonic material. Its transparency at telecommunications 
      wavelengths makes it useless as a detector in that spectral region. And 
      its indirect bandgap means that the product of electron-hole recombination 
      is far more likely to be a phonon than a photon. To overcome the 
      indirect-bandgap problem, scientists have turned to Raman lasing, or to 
      doping or combining silicon with materials that can lase effectively.  The 
      Ohio researchers adopted the latter approach. They previously had studied 
      lasing in rare-earth-doped films of GaN on sapphire substrates and sought 
      to extend that technique to silicon substrates. They used substrates 
      developed by Nitronex that overcome the lattice and thermal-expansion 
      mismatch between silicon and GaN by depositing multiple A1GaN layers as 
      buffers between the silicon substrate and the 1-percent-atomic Eu-doped 
      GaN (see figure). A top cladding layer of AlGaN created a planar waveguide 
      of the whole structure.
 A 337-nm nitrogen laser with 
      600-ps pulses optically pumped the laser and created a population 
      inversion in the Eu ions, which subsequently lased at 620 nm. Incident on 
      the upper surface of the structure, the 337-nm radiation achieved thresh 
      old lasing at a density of ~117 kW/cm Although the current 
      experiment demonstrated lasing in the red spectral region, the scientists 
      believe that other rare-earth elements could be substituted for europium 
      to create lasers from the ultraviolet through the near-infrared. As evidence of lasing, the 
      re searchers cite the polarization of the output and line narrowing from 
      ~2.3 nm to ~1.9 nm at laser threshold. They also note the existence of 
      distinct longitudinal laser modes in the output spectrum of polished 
      sub-millimeter cavities. For example, in a 145-µm cavity, the mode spacing 
      was 0.56 nm, corresponding to a theoretical mode spacing of approximately 
      the same value.           
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