The delta-station for the AC device characterization at NanoLab is a brain child of Jason Heikenfeld. Initially the station was put up to measure luminance and the Electro luminance intensity of the GaN: RE ACTDEL devices. The station consists of Sony/Tektronics AFG 310 signal generator, Tektronics TDS 210 oscilloscope and a Minolta DP-101 luminance meter. The devices are driven by a 40X differential amplifier attached to the signal generator. All components are connected to a computer by which all data acquisition is made.

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