Scanning Electron Microscopy (SEM) is new technique that reveal three-dimensional pictures of surfaces with such high resolution that individual atoms can be imaged. The SEM accomplishes this by scanning a conducting probe over the surface while adjusting the height above the sample to maintain a constant tunneling current across a very narrow gap. The highly concentrated current allows the difference in height between the top of the atom on the substrate and the valleys to the adjacent atoms to be distinguished.

NanoLab has a SEM machine (International Scientific Instruments, SX-40A) and this ISI SX-40A has been serving NanoLab for many years. Recently, the Orion Video Capture Board is installed and calibrated to save images directly from SEM instrument.

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