The AFM determines the contours of a sample surface by using a micro-scale cantilever spring to sense the force between the outermost atom on the probe and the sample surface. We currently use a Digital Instruments Dimension 3100 atomic force microscope (AFM). This accepts samples up to 200mm for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, and Conduct both standard and advanced SPM imaging with the Dimension 3100 Scanning Probe Microscope (SPM). The Dimension 3100 performs all the major SPM techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm in diameter optics.